Conditioning of a new gun cavity towards 60 MV/m at PITZ

Author

Lederer, Stefan ; Asova, G. ; Baehr, J.W. ; Boulware, C. ; Grabosch, H.-J. ; Haenel, M. ; Khodyachykh, S. ; Korepanov, S. ; Petrosyan, B. ; Rimjaem, S. ; Scholz, T. ; Staykov, L. ; Stephan, Frank ; Boyanov, K. ; Richter, D. ; Roensch, J. ; Michelato, P. ;

Author_Institution

DESY, Zeuthen

fYear

2007

fDate

25-29 June 2007

Firstpage

971

Lastpage

973

Abstract

A new L-band photoelectron gun (prototype 3.2) has been installed for use with a 10 MW klystron at the Photo- Injector Test facility in Zeuthen (PITZ). This gun has been conditioned starting in April 2007 up to a maximum gradient of about 60 MV/m. The gun was tuned for resonance at 1.3 GHz, and stable operation has been achieved with 100 mus RF pulses with a repetition rate of 10 Hz. Over certain periods the gun has been conditioned at high gradient with RF pulses of 400 mus, and conditioning has to be continued at longer pulse lengths up to 700 mus. Maximum power in the gun has been achieved with a new RF waveguide phase shifter with a 2pi range. Dark current measurements have been performed with several cathodes, including uncoated molybdenum, electropolished uncoated molybdenum, and cesium telluride. Also, the first photoelectrons have been accelerated with the new gun cavity.

Keywords

accelerator RF systems; accelerator cavities; cathodes; electron beams; electron guns; free electron lasers; klystrons; particle beam injection; waveguides; L-band photoelectron gun; PITZ; Photo-Injector Test facility; RF waveguide phase shifter; Zeuthen; cathodes; cesium telluride; dark current; electron beam; electropolished uncoated molybdenum; free electron laser; frequency 1.3 GHz; gun cavity; klystron; photoelectrons; pulse lengths; uncoated molybdenum; Current measurement; Dark current; Klystrons; L-band; Performance evaluation; Phase shifters; Prototypes; Radio frequency; Resonance; Test facilities;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 2007. PAC. IEEE

Conference_Location

Albuquerque, NM

Print_ISBN

978-1-4244-0916-7

Type

conf

DOI

10.1109/PAC.2007.4440952

Filename

4440952