• DocumentCode
    2895793
  • Title

    Fault tolerant methods for reliability in FPGAs

  • Author

    Stott, Edward ; Sedcole, Pete ; Cheung, Peter Y K

  • Author_Institution
    Electr. & Electron. Eng., Imperial Coll. London, London
  • fYear
    2008
  • fDate
    8-10 Sept. 2008
  • Firstpage
    415
  • Lastpage
    420
  • Abstract
    Reliability and process variability are serious issues for FPGAs in the future. Fortunately FPGAs have the ability to reconfigure in the field and at runtime, thus providing opportunities to overcome some of these issues. This paper provides the first comprehensive survey of fault detection methods and fault tolerance schemes specifically for FPGAs, with the goal of laying a strong foundation for future research in this field. All methods and schemes are qualitatively compared and some particularly promising approaches highlighted.
  • Keywords
    fault location; fault tolerant computing; field programmable gate arrays; integrated circuit reliability; FPGA reliability; fault detection methods; fault tolerant methods; Circuit faults; Degradation; Dielectrics; Electrical fault detection; Fault detection; Fault tolerance; Field programmable gate arrays; Integrated circuit interconnections; Manufacturing; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field Programmable Logic and Applications, 2008. FPL 2008. International Conference on
  • Conference_Location
    Heidelberg
  • Print_ISBN
    978-1-4244-1960-9
  • Electronic_ISBN
    978-1-4244-1961-6
  • Type

    conf

  • DOI
    10.1109/FPL.2008.4629973
  • Filename
    4629973