Title :
Fault tolerant methods for reliability in FPGAs
Author :
Stott, Edward ; Sedcole, Pete ; Cheung, Peter Y K
Author_Institution :
Electr. & Electron. Eng., Imperial Coll. London, London
Abstract :
Reliability and process variability are serious issues for FPGAs in the future. Fortunately FPGAs have the ability to reconfigure in the field and at runtime, thus providing opportunities to overcome some of these issues. This paper provides the first comprehensive survey of fault detection methods and fault tolerance schemes specifically for FPGAs, with the goal of laying a strong foundation for future research in this field. All methods and schemes are qualitatively compared and some particularly promising approaches highlighted.
Keywords :
fault location; fault tolerant computing; field programmable gate arrays; integrated circuit reliability; FPGA reliability; fault detection methods; fault tolerant methods; Circuit faults; Degradation; Dielectrics; Electrical fault detection; Fault detection; Fault tolerance; Field programmable gate arrays; Integrated circuit interconnections; Manufacturing; Switching circuits;
Conference_Titel :
Field Programmable Logic and Applications, 2008. FPL 2008. International Conference on
Conference_Location :
Heidelberg
Print_ISBN :
978-1-4244-1960-9
Electronic_ISBN :
978-1-4244-1961-6
DOI :
10.1109/FPL.2008.4629973
