Title :
Evaluation of loss characteristics of high-quality varactor diodes
Author :
Blake, C. ; Bowles, L. ; Dominick, F. ; Getsinger, W. ; McCurley, E.
Author_Institution :
MIT Lincoln Laboratory, Lexington, MA, USA
Keywords :
Cutoff frequency; Diodes; Electrical resistance measurement; Frequency measurement; Length measurement; Loss measurement; Microwave devices; Propagation losses; Transmission line measurements; Varactors;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157532
