• DocumentCode
    2895868
  • Title

    A sub-electron readout noise CMOS image sensor with pixel-level open-loop voltage amplification

  • Author

    Lotto, Christian ; Seitz, Peter ; Baechler, Thomas

  • Author_Institution
    Heliotis, Root Längenbold, Switzerland
  • fYear
    2011
  • fDate
    20-24 Feb. 2011
  • Firstpage
    402
  • Lastpage
    404
  • Abstract
    An ultra-low-noise CMOS image sensor based on an alternative pixel circuit featuring pixel-level voltage amplification is reported. Besides a significant reduction in the contribution of electronic noise generated in column-level circuits, pixel-level voltage amplification achieves sub-electron noise of the pixel-level circuit even without any column-level low-pass filter.
  • Keywords
    CMOS image sensors; integrated circuit noise; low noise amplifiers; readout electronics; column-level circuit; electronic noise reduction; pixel-level circuit; pixel-level open-loop voltage amplification; subelectron readout noise; ultra-low-noise CMOS image sensor; CMOS image sensors; Capacitance; Noise; Pixel; Threshold voltage; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-61284-303-2
  • Type

    conf

  • DOI
    10.1109/ISSCC.2011.5746370
  • Filename
    5746370
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2895868