Title :
A sub-electron readout noise CMOS image sensor with pixel-level open-loop voltage amplification
Author :
Lotto, Christian ; Seitz, Peter ; Baechler, Thomas
Author_Institution :
Heliotis, Root Längenbold, Switzerland
Abstract :
An ultra-low-noise CMOS image sensor based on an alternative pixel circuit featuring pixel-level voltage amplification is reported. Besides a significant reduction in the contribution of electronic noise generated in column-level circuits, pixel-level voltage amplification achieves sub-electron noise of the pixel-level circuit even without any column-level low-pass filter.
Keywords :
CMOS image sensors; integrated circuit noise; low noise amplifiers; readout electronics; column-level circuit; electronic noise reduction; pixel-level circuit; pixel-level open-loop voltage amplification; subelectron readout noise; ultra-low-noise CMOS image sensor; CMOS image sensors; Capacitance; Noise; Pixel; Threshold voltage; Transistors;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746370
