Title :
A 128×96 pixel event-driven phase-domain ΔΣ-based fully digital 3D camera in 0.13μm CMOS imaging technology
Author :
Walker, Richard J. ; Richardson, Justin A. ; Henderson, Robert K.
Author_Institution :
Univ. of Edinburgh, Edinburgh, UK
Abstract :
Low-cost 3D image capture devices are enabling new applications in the gaming, robotics, automotive and surveillance industries. A number of approaches are competing for a share of these markets. Stereoscopic cameras employ intensive image processing to interpret distance from the correlation of two separate image streams [1], structured light systems analyse the deformation of pat terned light projected over the scene, while time-of-flight (TOF) cameras require custom frequency-modulated image sensors and optical sources to measure the phase or return time of reflected light pulses. As rapid progress is made on com pact, high-frequency NIR LEDs, much research is being devoted to improve ments in the size, sensitivity and resolution of TOF image sensors. Analog pixel approaches provide compact pixel implementations but accuracy is limited by noise sources and nonlinearities of the analog electronics [2]. Single Photon Avalanche Diodes (SPADs) circumvent these issues and enable fully digital dis tance computation down to millimetric accuracy [3] by either direct or indirect demodulation schemes.
Keywords :
CMOS image sensors; avalanche diodes; cameras; delta-sigma modulation; demodulation; stereo image processing; ΔΣ-based fully digital 3D camera; 3D image capture devices; CMOS imaging technology; NIR LED; SPAD; TOF cameras; TOF image sensors; analog electronics; analog pixel approaches; compact pixel implementations; custom frequency-modulated image sensors; event-driven phase-domain; fully digital distance computation; image streams; indirect demodulation scheme; intensive image processing; millimetric accuracy; optical sources; patterned light; reflected light pulses; single photon avalanche diodes; size 0.13 mum; stereoscopic cameras; structured light systems; time-of-flight cameras; CMOS integrated circuits; Image sensors; Light emitting diodes; Optical variables measurement; Pixel; Radiation detectors; Three dimensional displays;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746374