Title :
Built-In Self-Repair Techniques for Heterogeneous Memory Cores
Author :
Wang, Zhen-Yu ; Tsai, Yi-Ming ; Lu, Shyue-Kung
Author_Institution :
Dept. of Electron. Eng., Fu-Jen Catholic Univ., Taipei, Taiwan
Abstract :
In this paper, BISR (built-in self-repair) techniques for heterogeneous multiple memory cores with divided redundancy mechanism are proposed. Redundant memories are partitioned into row blocks and column blocks and shared among all memory cores in the same memory group. Therefore, unlike the traditional redundancy mechanism, a row (column) block is used as the basic replacement element. Based on the proposed divided redundancy mechanism, a heuristic heterogeneous extended spare pivoting (HESP) redundancy analysis algorithm suitable for built-in implementation is also proposed. Experimental results show that repair rates can be improved significantly due to the efficient usage of redundancy. Moreover, the area overhead of the BISR circuitry for an example with four memory instances is only 1.12%.
Keywords :
DRAM chips; built-in self test; BISR; built-in implementation; built-in self-repair techniques; column blocks; divided redundancy mechanism; heterogeneous memory cores; heuristic heterogeneous extended spare pivoting; redundancy analysis algorithm; row blocks; Algorithm design and analysis; Built-in self-test; Circuit faults; Fault detection; Hardware; Information analysis; Random access memory; Redundancy; Semiconductor device manufacture; Testing; BISR; Reliability; Yield; memory;
Conference_Titel :
Dependable Computing, 2009. PRDC '09. 15th IEEE Pacific Rim International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3849-5
DOI :
10.1109/PRDC.2009.19