Title :
Fault Injection Scheme for Embedded Systems at Machine Code Level and Verification
Author :
Jin, Ang ; Jiang, Jian-hui
Author_Institution :
Dept. of Comput. Sci. & Technol., Tongji Univ., Shanghai, China
Abstract :
In order to evaluate software from the third party whose source codes are not available, after a careful analysis of the statistic data sorted by orthogonal defect classification, and the corresponding relation between patterns of high level language programs and machine codes, we propose a fault injection scheme at machine code level suitable respectively to the IA32 ARM and MIPS architecture, which takes advantage of mutating machine code. To prove the feasibility and validity of this scheme, two sets of programs are chosen as our experimental target: Set I consists of two different versions of triangle testing algorithms, and Set II is a subset of the Mibench which is a collection of performance benchmark programs designed for embedded systems; we inject both high level faults into the source code written in C language and the corresponding machine code level faults directly into the executables, and monitor their running on Linux. The results from experiments show that at least 96% of total similarity degree is obtained. Therefore, we conclude that the effect of injecting corresponding faults on both the source code level and machine code level are mostly the same. Therefore, our scheme is rather useful in analyzing system behavior under faults.
Keywords :
C language; embedded systems; machine code listings; program testing; program verification; C language; IA32 ARM architecture; MIPS architecture; Mibench; embedded systems; fault injection scheme; high level language programs; mutating machine code; orthogonal defect classification; performance benchmark programs; program feasibility; program validity; software evaluation; triangle testing algorithms; verification; Benchmark testing; Computer architecture; Condition monitoring; Embedded computing; Embedded software; Embedded system; Genetic mutations; Hardware; High level languages; Pattern analysis; embedded program; fault injection at machine code level; mutation; similarity degree; software-implemented fault injection;
Conference_Titel :
Dependable Computing, 2009. PRDC '09. 15th IEEE Pacific Rim International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3849-5
DOI :
10.1109/PRDC.2009.68