• DocumentCode
    2896192
  • Title

    Precise Measurement Method for Complex Permittivity of Microwave Dielectric Substrate

  • Author

    Nishikawa, T. ; Wakino, K. ; Tanaka, H. ; Ishikawa, Y.

  • Author_Institution
    Murata Manufacturing Company Limited
  • fYear
    1988
  • fDate
    7-10 June 1988
  • Firstpage
    155
  • Lastpage
    156
  • Abstract
    A new technique for the measurement of the complex permittivity of dielectrie substrates using a dielectric resonator is reported. This method is a non-contact measurement using two dielectric resonators which support TE mode. This paper describes some examples of measurements.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on
  • Conference_Location
    Ibaraki, Japan
  • Type

    conf

  • DOI
    10.1109/CPEM.1988.671228
  • Filename
    671228
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2896192