Title :
PN junction sensors
Author :
Sikorski, Michael ; Bevins, D.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
Keywords :
Etching; Human factors; Microphones; Probes; Semiconductor diodes; Sensor phenomena and characterization; Testing; Tunneling; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157559
