• DocumentCode
    2896332
  • Title

    Memory error compensation techniques for JPEG2000

  • Author

    Emre, Yunus ; Chakrabarti, Chaitali

  • Author_Institution
    Sch. of Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2010
  • fDate
    6-8 Oct. 2010
  • Firstpage
    36
  • Lastpage
    41
  • Abstract
    This paper presents novel algorithm-specific techniques to mitigate the effects of failures in SRAM memory caused by voltage scaling and random dopant fluctuations in scaled technologies. We focus on JPEG2000 as a case study. We propose three techniques that exploit the fact that the high frequency subband outputs of the discrete wavelet transform (DWT) have small dynamic range and so errors in the most significant bits can be identified and corrected easily. These schemes do not require any additional memory and have low circuit overhead. We also study several error control coding schemes that are effective in combating errors when the memory failure rates are low. We compare the PSNR versus compression rate performance of the proposed schemes for different memory failure rates. Simulation results show that for high bit error rates (10-2), the error control coding techniques are not effective and that the algorithm-specific techniques can improve the PSNR quality of up to 10dB higher compared to that of the no-correction case.
  • Keywords
    SRAM chips; discrete wavelet transforms; error compensation; error statistics; image coding; JPEG2000; PSNR; SRAM memory; bit error rates; discrete wavelet transform; error control coding; memory error compensation; random dopant fluctuations; voltage scaling; Discrete wavelet transforms; Encoding; Error correction codes; Image coding; Power demand; Random access memory; Transform coding; JPEG2000; SRAM; error tolerance; voltage scaling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Systems (SIPS), 2010 IEEE Workshop on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1520-6130
  • Print_ISBN
    978-1-4244-8932-9
  • Electronic_ISBN
    1520-6130
  • Type

    conf

  • DOI
    10.1109/SIPS.2010.5624759
  • Filename
    5624759