Title :
Experimental and statistical analysis of blind spots for UHF RFID portal applications
Author :
Kai, She ; Yigang, He ; Lei, Zuo ; Gefeng, Fang
Author_Institution :
Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, China
Abstract :
The radiation field of a typical UHF RFID portal application was measured using our developed LabVIEW based automatic test platform. Path loss exponent and standard deviation of Log-normal shadowing model were obtained through MMSE criteria from measured data. Rician and Rayleigh empirical models were also introduced to predict the probability of blind spots. And fade margins were successfully compared for different blind spots probability.
Keywords :
automatic testing; blind source separation; least mean squares methods; power system measurement; probability; radiofrequency identification; regression analysis; virtual instrumentation; LabVIEW based automatic test platform; MMSE criteria; Rayleigh empirical models; Rician empirical models; UHF RFID portal applications; blind spots probability; fade margins; log normal shadowing model; path loss exponent; radiation field; standard deviation; statistical analysis; Loss measurement; Mathematical model; Portals; Probability; Radiofrequency identification; Rician channels; UHF measurements; LabVIEW; blind spots; intelligent grid; propagation measurements; radio frequency identification (RFID);
Conference_Titel :
Electric Utility Deregulation and Restructuring and Power Technologies (DRPT), 2011 4th International Conference on
Conference_Location :
Weihai, Shandong
Print_ISBN :
978-1-4577-0364-5
DOI :
10.1109/DRPT.2011.5994122
