• DocumentCode
    2896673
  • Title

    An event based approach to video analysis and keyframe selection

  • Author

    Omidyeganeh, M. ; Ghaemmaghami, S. ; Shirmohammadi, S.

  • Author_Institution
    Electr. Eng. Dept., Sharif Univ. of Technol., Tehran, Iran
  • fYear
    2010
  • fDate
    6-8 Oct. 2010
  • Firstpage
    128
  • Lastpage
    133
  • Abstract
    We propose an event based approach for locating keyframes in natural video through detection of locally correlated spectral targets. Temporal Decomposition (TD) is used to describe a set of spectral parameters of the video as a linear combination of a set of temporally overlapping event functions. This process provides preliminary information about keyframes, by selecting the frames located at event centroids as the keyframe candidates. No shot or shot cluster boundary detection is needed and keyframes are extracted directly from among event centroids that are much smaller in number than the number of frames. Generalized Gaussian Density (GGD) parameters, extracted from 2D wavelet transform subbands of the frames, are used as the spectral parameters in the event detection process and Kullback-Leibler distance (KLD) is employed as a measure to select salient keyframes. Experimental results confirm superiority of the proposed scheme over the conventional keyframe selection approaches.
  • Keywords
    Gaussian processes; feature extraction; image sequences; object detection; video signal processing; wavelet transforms; 2D wavelet transform subband; Kullback-Leibler distance; cluster boundary detection; correlated spectral target detection; event based approach; generalized Gaussian density parameter; keyframe selection; temporal decomposition; video analysis; Approximation methods; Feature extraction; Mathematical model; Video sequences; Visualization; Wavelet transforms; Video scene analysis; event function; keyframe selection; temporal decomposition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Systems (SIPS), 2010 IEEE Workshop on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1520-6130
  • Print_ISBN
    978-1-4244-8932-9
  • Electronic_ISBN
    1520-6130
  • Type

    conf

  • DOI
    10.1109/SIPS.2010.5624775
  • Filename
    5624775