Title :
Thermal feedback and 1/f-flicker noise in semiconductor devices
Author_Institution :
Communication Products, General Electric Co., Lynchburg, VA, USA
Keywords :
Circuit noise; Equations; Feedback; Frequency; Noise figure; Noise generators; Semiconductor device noise; Semiconductor devices; Temperature; Thermal resistance;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1965.1157611
