DocumentCode :
2897300
Title :
Design For Reliabiltiy
Author :
Rennels, David A. ; Tamir, Yuval ; Tyree, Vance C.
Author_Institution :
University of California Los Angeles
fYear :
1992
fDate :
25-28 Oct. 1992
Firstpage :
23
Lastpage :
28
Keywords :
Circuit faults; Computer science; Fabrication; Packaging; Power dissipation; Power system reliability; Senior members; Single event upset; Total quality management; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Level Reliability Workshop, 1992. Final Report., 1992 International
Conference_Location :
Lake Tahoe, CA, USA
Type :
conf
DOI :
10.1109/IWLR.1992.657980
Filename :
657980
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2897300
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