• DocumentCode
    2897315
  • Title

    Higher-level state machine based coverage analysis in RTL verification

  • Author

    Lee, Seungbeom ; Park, Sin-Chong

  • Author_Institution
    Syst. Integration Technol. Inst., Inf. & Commun. Univ., Daejeon, South Korea
  • Volume
    2
  • fYear
    2004
  • fDate
    26-29 Oct. 2004
  • Firstpage
    1090
  • Abstract
    Simulation is one of the most well-known methods for functional verification. The major problem of the simulation approach is to choose a good metric to deliver a high level of confidence in the hardware design. For example, sub-blocks of a wireless system, such as a channel decoder, consist of a data path and control unit. But most of these blocks can not be divided, exactly, into the data path part and the control part. Previous circuit-based metrics like FSM or data-path based metric are not efficient in these blocks. A higher level state machine model is proposed to replace the circuit-based coverage model in the coverage test. This higher-level state machine models one behavior or one operation as one state, so it is called a behavioral state machine (BSM). The state is identified by a condition statement such as if-then-else or case. This leads to the reduction of the number of state machines compared to previous FSM and consideration of data path coverage. Our examples show a performance comparison between our scheme and line code coverage.
  • Keywords
    automata theory; circuit simulation; formal verification; hardware description languages; RTL verification; behavioral state machine; circuit-based coverage model; condition statement; functional verification; higher level state machine model; simulation; wireless system sub-blocks; Analytical models; Circuit simulation; Circuit testing; Control systems; Decoding; Hardware design languages; Information analysis; Monitoring; Shift registers; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Information Technology, 2004. ISCIT 2004. IEEE International Symposium on
  • Print_ISBN
    0-7803-8593-4
  • Type

    conf

  • DOI
    10.1109/ISCIT.2004.1413888
  • Filename
    1413888