Title :
A nanosecond monolithic TTL gate
Author :
Spiegel, P. ; Luce, R.
Author_Institution :
Philco Corp., Lansdale, PA, USA
Keywords :
Application specific integrated circuits; Degradation; Delay effects; Fabrication; Inverters; Parasitic capacitance; Power dissipation; Silicon; Switches; Switching circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1965.1157617
