Title :
Aluminum alloy junction backward diodes in microwave detection systems
Author :
Wright, Ryan ; Goldman, R.
Author_Institution :
Philco Corp., Lansdale, CA, USA
Keywords :
Aluminum alloys; Capacitance; Detectors; Diodes; Etching; Frequency; Monitoring; Noise figure; Sequential analysis; Temperature;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1965.1157624
