Uniformity of field emission electron beam and picosecond field emission from metallic field emitter arrays under high electric field

Author

Tsujino, Soichiro ; Paraliev, Martin ; Kirk, Eugenie ; Braun, Hans-H

Author_Institution

Lab. for Micro- & Nanotechnol. & SwissFEL, Paul Scherrer Inst., Villigen, Switzerland

fYear

2012

fDate

24-26 April 2012

Firstpage

131

Lastpage

132

Abstract

Field-emission characteristics and evolution of beam profile under noble-gas conditioning were studied for a metallic field emitter array cathode using a dc-gun teststand. Whereas dc conditioning procedure resulted in a granular beam, improvement of the beam-uniformity by in-situ conditioning procedure using Ne-gas was demonstrated.

Keywords

cathodes; electric fields; electron beams; electron guns; field emitter arrays; Ne; beam profile evolution; beam-uniformity; dc conditioning; dc-gun teststand; electric field; field emission electron beam; field-emission characteristics; granular beam; metallic field emitter array cathode; neon gas; noble-gas conditioning; picosecond field emission; Cathodes; Electric potential; Field emitter arrays; Kirk field collapse effect; Logic gates; Particle beams; beam uniformity; field emission; field emitter array; high acceleration electric field; pulsed field emission;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International

Conference_Location

Monterey, CA

Print_ISBN

978-1-4673-0188-6

Electronic_ISBN

978-1-4673-0187-9

Type

conf

DOI

10.1109/IVEC.2012.6262103

Filename

6262103