Title :
Monolithic ferrite-integrated storage diode memory
Author :
Kaufman, M. ; Pryor, R.
Author_Institution :
EDP Applied Research, RCA, Camden, NJ, USA
Keywords :
Anodes; Cathodes; Circuit testing; Diodes; Driver circuits; Fabrication; Ferrites; Glass; Sequential analysis; Strips;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1966 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1966.1157652
