Title :
Building-in Reliability at SGC-THOMSON Microelectronics
Author :
Hoang, Hoang Huy
Author_Institution :
Process Reliability Engineering
Keywords :
Microelectronics; Production; Reliability engineering;
Conference_Titel :
Wafer Level Reliability Workshop, 1992. Final Report., 1992 International
Conference_Location :
Lake Tahoe, CA, USA
DOI :
10.1109/IWLR.1992.657983
