DocumentCode
2897932
Title
A CMOS voltage reference combining body effect with switched-current technique
Author
Ning Ren ; Hao Zhang ; Yoshihara, Tatsuhiko
Author_Institution
Grad. Sch. of Inf., Waseda Univ., Kitakyushu, Japan
fYear
2012
fDate
4-7 Nov. 2012
Firstpage
92
Lastpage
95
Abstract
A precise CMOS voltage reference using body effect and switched-current technique is presented in this paper. To reduce static current, the threshold voltage with body effect in nMOSFET transistor is utilized instead of the VBE of BJT transistor. Owning to the switched-current technique, only one transistor is required to generate the reference voltage, so that the threshold voltage mismatch in conventional two-transistor configuration is eliminated. The proposed circuit is designed and simulated under 0.18-μm CMOS technology. The output voltage is 147.44 mV, and the temperature coefficient is less than 5.2 ppm/°C ranging from -20°C to 100°C. The voltage line-sensitivity is 0.44 %/V ranging from 1.5 V to 3.3 V. The power-supply-rejection-ratio (PSRR) is -56 dB at 100 Hz. The average current consumption is about 16 μA.
Keywords
CMOS integrated circuits; switched current circuits; BJT transistor; CMOS voltage reference; body effect; frequency 100 Hz; nMOSFET transistor; power-supply-rejection-ratio; static current; switched-current technique; threshold voltage; voltage 1.5 V; voltage 3.3 V; CMOS integrated circuits; Capacitors; MOSFET circuits; Resistors; Switching circuits; Threshold voltage; Transistors; CMOS voltage reference; body effect; subthreshold; switched-current technique;
fLanguage
English
Publisher
ieee
Conference_Titel
SoC Design Conference (ISOCC), 2012 International
Conference_Location
Jeju Island
Print_ISBN
978-1-4673-2989-7
Electronic_ISBN
978-1-4673-2988-0
Type
conf
DOI
10.1109/ISOCC.2012.6407047
Filename
6407047
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