• DocumentCode
    2897949
  • Title

    Use of local measurements to estimate voltage-stability margin

  • Author

    Vu, Khoi ; Begovic, Miroslav M. ; Novosel, Damir ; Saha, Murari Mohan

  • Author_Institution
    ABB Trans. Tech. Inst., Raleigh, NC, USA
  • fYear
    1997
  • fDate
    11-16 May 1997
  • Firstpage
    318
  • Lastpage
    323
  • Abstract
    Estimating the proximity of power systems to voltage collapse in real-time still faces difficulties. Beside the data management and computational issues, any central-control method is subject to the reliability of long-distance data communications. In the paper, the authors describe a new data-processing method to estimate the proximity to voltage collapse. The method (code-named SMARTDevice, for Stability Monitoring And Reference Tuning Device) employs only local measurements-bus voltage and load current-and calculates the strength of the transmission system relative to the bus. The collapse occurs when the local load approaches this value. The method is simple enough so that it can be implemented in a numerical relay. The performance of SMARTDevice is compared against the conventional undervoltage relays. It is shown that the latter can misoperate while the new device does not. SMARTDevice is in fact a new breed of voltage relay whose setpoint is automatically tuned to the power system condition
  • Keywords
    power system analysis computing; power system measurement; power system stability; power transmission; transmission network calculations; SMARTDevice; bus voltage; computer simulation; data-processing method; load current; local measurements; performance; power system voltage-stability margin estimation; transmission system strength; Current measurement; Data communication; Monitoring; Power system management; Power system measurements; Power system relaying; Power system reliability; Real time systems; Stability; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Industry Computer Applications., 1997. 20th International Conference on
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    0-7803-3713-1
  • Type

    conf

  • DOI
    10.1109/PICA.1997.599420
  • Filename
    599420