Title :
A consideration on the Electrical Overstress(EOS) failure mechanism in the interconnection system of liquid crystal display(LCD) panel
Author :
Kim, Jae-Hyung ; Kim, Dong-Nam ; Jang, Ho-Cheol ; Jo, Young-Chul ; Kim, Nam-Yong ; Kang, Seung-Geun ; Lee, Byung-Ju ; Kim, Dal-Soo
Author_Institution :
TLi, Inc., Seongnam, South Korea
fDate :
Nov. 30 2010-Dec. 2 2010
Abstract :
The IC industry has been paid a large amount of quality cost for Electrical Overstress(EOS) damages. This paper described the failure analysis procedure to find EOS source and the experimental methodology to verify the failure mechanism in the subsystems of the LCD panel interconnected with printed circuit boards.
Keywords :
failure analysis; liquid crystal displays; printed circuits; EOS source; electrical overstress failure mechanism; failure analysis; interconnection system; liquid crystal display panel; printed circuit boards; Earth Observing System; Electrostatic discharge; Failure analysis; Integrated circuits; Pins; Surge protection; Surges;
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2010 34th IEEE/CPMT International
Conference_Location :
Melaka
Print_ISBN :
978-1-4244-8825-4
DOI :
10.1109/IEMT.2010.5746676
