Title :
Monolithic sub-nanosecond switch
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Keywords :
Circuit stability; Circuit testing; Delay effects; Feedback circuits; Logic; Negative feedback; Output feedback; Propagation delay; Switches; Switching circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1966 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1966.1157666
