Title :
Precision circuitry for 110 Mb/s analog-to-digital conversion
Author :
Fleischman, J. ; Saari, V.
Author_Institution :
Bell Telephone Labs., Inc., Murray Hill, NJ, USA
Keywords :
Analog-digital conversion; Bandwidth; Circuits; Detectors; Diodes; Impedance; Noise level; Operational amplifiers; Packaging; Reflective binary codes;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1966 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1966.1157672
