Title :
Invited: Potential applications and the noise problem in the reade avalanche diode
Author_Institution :
Microwave Associates, Inc., Burlington, MA, USA
Keywords :
Capacitance; Circuit noise; Diodes; Equations; Fluctuations; Frequency; Noise figure; Noise level; Oscillators; Phase noise;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1966 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1966.1157674
