DocumentCode :
2898317
Title :
On the Linearization of MOSFET Capacitors
Author :
Danaie, Mohammad ; Aminzadeh, Hamed ; Naseh, Sasan
Author_Institution :
Comput. & Commun. Res. Center, Ferdowsi Univ. of Mashhad
fYear :
2007
fDate :
27-30 May 2007
Firstpage :
1943
Lastpage :
1946
Abstract :
In this paper, a heuristic methodology for design of highly linear MOSFET capacitors (MOSCAPs) has been presented. For a certain amount of accessible chip area, the proposed algorithm intends to find the structure which has the least C-V variation. It uses a modified version of the genetic programming to optimize the capacitor topology and transistors´ dimensions. To test the performance of the algorithm, it was utilized for obtaining a highly linear 1 pF capacitor, i.e. with less than 3% variation of capacitance versus 1 V variation across the MOSCAP structure terminals, in a commercial 0.18 mum standard digital CMOS technology. This level of linearity can be otherwise achieved only with MIM capacitors, which are not available in digital CMOS processes.
Keywords :
CMOS integrated circuits; MOS capacitors; MOSFET; genetic algorithms; linearisation techniques; technology CAD (electronics); 1 V; 1 pF; CAD tool; CMOS technology; MIM capacitors; MOSFET capacitors; genetic programming; CMOS technology; Capacitance; Capacitance-voltage characteristics; Design methodology; Genetic programming; Linearity; MIM capacitors; MOSFET circuits; Testing; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
Type :
conf
DOI :
10.1109/ISCAS.2007.378356
Filename :
4253045
Link To Document :
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