• DocumentCode
    2898383
  • Title

    SymPLFIED: Symbolic program-level fault injection and error detection framework

  • Author

    Pattabiraman, Karthik ; Nakka, Nithin ; Kalbarczyk, Zbigniew ; Iyer, Ravishankar

  • Author_Institution
    Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL
  • fYear
    2008
  • fDate
    24-27 June 2008
  • Firstpage
    472
  • Lastpage
    481
  • Abstract
    This paper introduces SymPLFIED, a program-level framework that allows specification of arbitrary error detectors and the verification of their efficacy against hardware errors. SymPLFIED comprehensively enumerates all transient hardware errors in registers, memory, and computation (expressed as value errors) that potentially evade detection and cause program failure. The framework uses symbolic execution to abstract the state of erroneous values in the program and model checking to comprehensively find all errors that evade detection. We demonstrate the use of SymPLFIED on a widely deployed aircraft collision avoidance application, tcas. Our results show that the SymPLFIED framework can be used to uncover hard-to-detect corner cases caused by transient errors in programs that may not be exposed by random fault-injection based validation.
  • Keywords
    error detection; fault diagnosis; program verification; SymPLFIED; arbitrary error detectors; error detection framework; hard-to-detect corner cases; model checking; program-level framework; random fault-injection; symbolic execution; symbolic program-level fault injection; transient hardware errors; Aircraft; Assembly; Circuit faults; Collision avoidance; Detectors; Fault detection; Fault diagnosis; Hardware; Registers; Scalability; Dependability validation; Error detectors; Fault injection; Model checking; Symbolic execution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks With FTCS and DCC, 2008. DSN 2008. IEEE International Conference on
  • Conference_Location
    Anchorage, AK
  • Print_ISBN
    978-1-4244-2397-2
  • Electronic_ISBN
    978-1-4244-2398-9
  • Type

    conf

  • DOI
    10.1109/DSN.2008.4630118
  • Filename
    4630118