Title :
Invited: Current understanding of HF instabilities in bulk semiconductors
Author_Institution :
Bell Telephone Labs., Murray Hill, NJ, USA
Keywords :
Avalanche breakdown; Diodes; Electron devices; Equations; Frequency; Gunn devices; Hafnium; Motion pictures; Plasmas; Solids;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1966 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1966.1157680
