DocumentCode

2898472

Title

Invited: Current understanding of HF instabilities in bulk semiconductors

Author

Chynoweth, A.

Author_Institution

Bell Telephone Labs., Murray Hill, NJ, USA

Volume

IX

fYear

1966

fDate

9-11 Feb. 1966

Firstpage

80

Lastpage

81

Keywords

Avalanche breakdown; Diodes; Electron devices; Equations; Frequency; Gunn devices; Hafnium; Motion pictures; Plasmas; Solids;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1966 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1966.1157680

Filename

1157680