Title :
An integrated temperature sensor-controller
Author_Institution :
Stewart-Warner Microcircuits, Inc., Sunnyvale, CA, USA
Keywords :
Breakdown voltage; Circuits; Logic devices; Semiconductor device noise; Semiconductor diodes; Substrates; Temperature control; Temperature measurement; Temperature sensors; Working environment noise;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1966 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1966.1157683
