DocumentCode :
2898672
Title :
Study of the effect of surface roughness and skin depth on the conductivity of metals at 650 GHz
Author :
Kirley, Matt P. ; Carlsson, Nils ; Yang, Benjamin B. ; Booske, John H.
Author_Institution :
ECE Dept., Univ. of Wisconsin-Madison, Madison, WI, USA
fYear :
2012
fDate :
24-26 April 2012
Firstpage :
239
Lastpage :
240
Abstract :
A high-quality-factor quasi-optical resonator operating at 650 GHz is used to measure the conductivity of mechanically roughened metal surfaces. The results explore the effective conductivity of metals in the terahertz regime when the surface roughness is on the order of the skin depth.
Keywords :
electrical conductivity measurement; resonators; submillimetre wave measurement; surface roughness; conductivity measurement; frequency 650 GHz; high-quality-factor quasi-optical resonator; mechanically roughened metal surfaces; metal conductivity; skin depth; surface roughness effect; Conductivity; Metals; Rough surfaces; Skin; Surface impedance; Surface roughness; Surface topography; THz; conductivity; skin depth; surface roughness; vacuum electronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0188-6
Electronic_ISBN :
978-1-4673-0187-9
Type :
conf
DOI :
10.1109/IVEC.2012.6262147
Filename :
6262147
Link To Document :
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