DocumentCode
2898902
Title
Concurrent design for robust and cost efficient semiconductor manufacturing
Author
Lee, Foo Yeong ; Lin, Lim Siew ; Yong, Wang Mei
Author_Institution
Infineon Technol. (M) Sdn Bhd, Batu Berendam, Malaysia
fYear
2010
fDate
Nov. 30 2010-Dec. 2 2010
Firstpage
1
Lastpage
6
Abstract
Rapid development in the semiconductor industry requires close collaboration between the design and manufacturing teams in order to increase performance, reduce cost and improve the quality of the electronic products manufactured. The current development process is mainly chip-driven design flow that regards package design as a small add-on. This paper proposes the concurrent design concept of chip and package to fully exploit concurrent design benefits to overall product life cycle performance. Successful deployment of the concurrent design concept allows both the chip and package designers from different geographical locations to incorporate the best design attributes into the semiconductor products. This ensures both product quality and reliability requirement are achieved. The concurrent design concept is further expanded by the introduction of group technology approach into lead frame design for better cost management.
Keywords
concurrent engineering; cost reduction; electronics packaging; product design; product life cycle management; quality management; rapid prototyping (industrial); semiconductor device reliability; semiconductor industry; chip-driven design flow; concurrent design; cost efficient semiconductor manufacturing; cost management; cost reduction; design attribute; electronic products; package design; product life cycle performance; product quality requirement; product reliability requirement; quality improvement; robust manufacturing; semiconductor industry; semiconductor product; Lead; Materials; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2010 34th IEEE/CPMT International
Conference_Location
Melaka
ISSN
1089-8190
Print_ISBN
978-1-4244-8825-4
Type
conf
DOI
10.1109/IEMT.2010.5746717
Filename
5746717
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