• DocumentCode
    2898902
  • Title

    Concurrent design for robust and cost efficient semiconductor manufacturing

  • Author

    Lee, Foo Yeong ; Lin, Lim Siew ; Yong, Wang Mei

  • Author_Institution
    Infineon Technol. (M) Sdn Bhd, Batu Berendam, Malaysia
  • fYear
    2010
  • fDate
    Nov. 30 2010-Dec. 2 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Rapid development in the semiconductor industry requires close collaboration between the design and manufacturing teams in order to increase performance, reduce cost and improve the quality of the electronic products manufactured. The current development process is mainly chip-driven design flow that regards package design as a small add-on. This paper proposes the concurrent design concept of chip and package to fully exploit concurrent design benefits to overall product life cycle performance. Successful deployment of the concurrent design concept allows both the chip and package designers from different geographical locations to incorporate the best design attributes into the semiconductor products. This ensures both product quality and reliability requirement are achieved. The concurrent design concept is further expanded by the introduction of group technology approach into lead frame design for better cost management.
  • Keywords
    concurrent engineering; cost reduction; electronics packaging; product design; product life cycle management; quality management; rapid prototyping (industrial); semiconductor device reliability; semiconductor industry; chip-driven design flow; concurrent design; cost efficient semiconductor manufacturing; cost management; cost reduction; design attribute; electronic products; package design; product life cycle performance; product quality requirement; product reliability requirement; quality improvement; robust manufacturing; semiconductor industry; semiconductor product; Lead; Materials; Production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2010 34th IEEE/CPMT International
  • Conference_Location
    Melaka
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-8825-4
  • Type

    conf

  • DOI
    10.1109/IEMT.2010.5746717
  • Filename
    5746717