A Fully Integrated Fail-safe Stimulator Output Stage Dedicated to FES Stimulation

Author

Liu, Xiao ; Demosthenous, Andreas ; Donaldson, Nick

Author_Institution

Dept. of Electron. & Electr. Eng., Univ. Coll. London

fYear

2007

fDate

27-30 May 2007

Firstpage

2076

Lastpage

2079

Abstract

There is a great demand to reduce the volume of implantable multi-channel stimulators for functional electrical stimulation applications. Miniaturization is currently limited by the size of the large off-chip blocking capacitors that are required for safety. This paper describes a fail-safe stimulator output stage circuit utilizing the principle of high-frequency current-switching, which allows the blocking capacitors to be integrated on-chip. The proposed circuit is based on the bridge rectifier circuit, hence fully utilizing the bidirectional current through the blocking capacitor. The approach has been verified by post-layout simulations in a 1 mum CMOS SOI technology.

Keywords

bioelectric potentials; prosthetic power supplies; 1 micron; CMOS SOI technology; FES stimulation; bidirectional current; blocking capacitors; bridge rectifier circuit; fully integrated fail-safe stimulator output stage; high-frequency current-switching; implantable multi-channel stimulators; Biomedical engineering; Biomedical measurements; Capacitors; Condition monitoring; Electrochemical processes; Electrodes; Implants; Integrated circuit measurements; Protection; Safety;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on

Conference_Location

New Orleans, LA

Print_ISBN

1-4244-0920-9

Electronic_ISBN

1-4244-0921-7

Type

conf

DOI

10.1109/ISCAS.2007.378507

Filename

4253078