DocumentCode :
2898937
Title :
A Fully Integrated Fail-safe Stimulator Output Stage Dedicated to FES Stimulation
Author :
Liu, Xiao ; Demosthenous, Andreas ; Donaldson, Nick
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. London
fYear :
2007
fDate :
27-30 May 2007
Firstpage :
2076
Lastpage :
2079
Abstract :
There is a great demand to reduce the volume of implantable multi-channel stimulators for functional electrical stimulation applications. Miniaturization is currently limited by the size of the large off-chip blocking capacitors that are required for safety. This paper describes a fail-safe stimulator output stage circuit utilizing the principle of high-frequency current-switching, which allows the blocking capacitors to be integrated on-chip. The proposed circuit is based on the bridge rectifier circuit, hence fully utilizing the bidirectional current through the blocking capacitor. The approach has been verified by post-layout simulations in a 1 mum CMOS SOI technology.
Keywords :
bioelectric potentials; prosthetic power supplies; 1 micron; CMOS SOI technology; FES stimulation; bidirectional current; blocking capacitors; bridge rectifier circuit; fully integrated fail-safe stimulator output stage; high-frequency current-switching; implantable multi-channel stimulators; Biomedical engineering; Biomedical measurements; Capacitors; Condition monitoring; Electrochemical processes; Electrodes; Implants; Integrated circuit measurements; Protection; Safety;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
Type :
conf
DOI :
10.1109/ISCAS.2007.378507
Filename :
4253078
Link To Document :
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