• DocumentCode
    2899556
  • Title

    Challenges in copper 2nd bond quality on nickel palladium leadframe

  • Author

    Heong, Tan Kian ; Harun, Fuaida

  • Author_Institution
    Infineon Technol. Sdn Bhd, Batu Berendam, Malaysia
  • fYear
    2010
  • fDate
    Nov. 30 2010-Dec. 2 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Nickel-palladium (NiPd) based lead finishes has been one of the options for lead-free electronics. Currently there are different types of NiPd finish in the industry like NiPdAuAg, NiPdAu and rough NiPdAuAg. These preplated lead frame finishes while eliminate the need for plating after assembly/encapsulation, it also has a few challenges especially on the 2nd bond wire bond quality. This is especially obvious when Cu wire bond was introduced. This paper will provide some insight, compare the 2nd bond performance when using Cu wire on both Ag plated frame and NiPd frame. It was observed that stitch pull strength for Cu wire bonding on rough uppf lead frame generally lower than the Ag plated Cu lead frame and percentage of Cu remain after stitch pull for rought μppf lead frame is lesser than the Ag plated lead frame. The different results possible due to different lead frame plating materials, plating thickness and hardness.
  • Keywords
    assembling; encapsulation; lead bonding; 2nd bond wire bond quality; Ag plated; Cu wire bonding; NiPd frame; NiPdAu; NiPdAuAg; assembly/encapsulation; copper 2nd bond quality; lead-free electronics; nickel palladium leadframe; rough NiPdAuAg; stitch pull strength; Copper; Lead; Nickel; Strips; Wire; micro pre-plated frame (uppf); non stick on lead (NSOL); stitch pull; stitch remain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2010 34th IEEE/CPMT International
  • Conference_Location
    Melaka
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-8825-4
  • Type

    conf

  • DOI
    10.1109/IEMT.2010.5746750
  • Filename
    5746750