• DocumentCode
    2899616
  • Title

    A new and simple test structure for evaluating the sectional photo-sensitivity distribution of pixels in a frame-transfer CCD image sensor

  • Author

    Okigawa, Mitsuru

  • Author_Institution
    Sanyo Electric Co. Ltd., Gifu, Japan
  • fYear
    1992
  • fDate
    16-19 Mar 1992
  • Firstpage
    134
  • Lastpage
    138
  • Abstract
    A metallic optical shield membrane with a rectangular grid of small apertures was formed on the imaging area of a solid-state frame transfer charge-coupled device (CCD) image sensor. This allowed evaluation of a single pixel. The optical apertures were considerably smaller than a single pixel, with the interval between apertures slightly larger than the spacing between pixels. Thus, each pixel has light impinging on only a very small portion on its surface. With a suitable choice of aperture spacing, the output of the CCD directly represents the sensitivity distribution of pixels in the CCD. The sensitivity distribution can be visualized by displaying the CCD output on a cathode-ray-tube monitor. The evaluation of pixel sensitivity distribution is valuable when designing CCD imaging elements
  • Keywords
    CCD image sensors; aperture spacing; cathode-ray-tube monitor; frame-transfer CCD image sensor; imaging area; imaging elements; metallic optical shield membrane; optical apertures; rectangular grid; sectional photo-sensitivity distribution; sensitivity distribution; solid-state frame transfer charge-coupled device; test structure; Apertures; Biomembranes; Charge coupled devices; Image sensors; Optical devices; Optical imaging; Optical sensors; Solid state circuits; Testing; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1992. ICMTS 1992. Proceedings of the 1992 International Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0535-3
  • Type

    conf

  • DOI
    10.1109/ICMTS.1992.185955
  • Filename
    185955