DocumentCode
2899616
Title
A new and simple test structure for evaluating the sectional photo-sensitivity distribution of pixels in a frame-transfer CCD image sensor
Author
Okigawa, Mitsuru
Author_Institution
Sanyo Electric Co. Ltd., Gifu, Japan
fYear
1992
fDate
16-19 Mar 1992
Firstpage
134
Lastpage
138
Abstract
A metallic optical shield membrane with a rectangular grid of small apertures was formed on the imaging area of a solid-state frame transfer charge-coupled device (CCD) image sensor. This allowed evaluation of a single pixel. The optical apertures were considerably smaller than a single pixel, with the interval between apertures slightly larger than the spacing between pixels. Thus, each pixel has light impinging on only a very small portion on its surface. With a suitable choice of aperture spacing, the output of the CCD directly represents the sensitivity distribution of pixels in the CCD. The sensitivity distribution can be visualized by displaying the CCD output on a cathode-ray-tube monitor. The evaluation of pixel sensitivity distribution is valuable when designing CCD imaging elements
Keywords
CCD image sensors; aperture spacing; cathode-ray-tube monitor; frame-transfer CCD image sensor; imaging area; imaging elements; metallic optical shield membrane; optical apertures; rectangular grid; sectional photo-sensitivity distribution; sensitivity distribution; solid-state frame transfer charge-coupled device; test structure; Apertures; Biomembranes; Charge coupled devices; Image sensors; Optical devices; Optical imaging; Optical sensors; Solid state circuits; Testing; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 1992. ICMTS 1992. Proceedings of the 1992 International Conference on
Conference_Location
San Diego, CA
Print_ISBN
0-7803-0535-3
Type
conf
DOI
10.1109/ICMTS.1992.185955
Filename
185955
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