Effect of surface roughness of high current density nano-particle cathode for terahertz vacuum devices application

Author

Barik, Ranjan K. ; Tanwar, Anil K. ; Baek, In K. ; Eom, Kihoon ; Bera, Anirban ; Sattorov, Matlabjon A. ; Min, Sun H. ; Kwon, Ohjoon J. ; Park, Gunsik S.

Author_Institution

Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea

fYear

2012

fDate

24-26 April 2012

Firstpage

369

Lastpage

370

Abstract

High current density dispenser cathode is critical need for used in high power terahertz devices. Recently scandate cathode using nanoparticle offers very high current density more than 100 A/cm². Fabrication of this kind of cathode is challenging issue due to its nano dimension of the particle size. One of the critical parameter is surface roughness of the emission surface. We develop dispenser cathode using tungsten nano-particle of average particle diameter ~50 nm, spherical morphology and uniform phase. In this paper we explain the effect of surface roughness on the emission current density of the dispenser cathode.

Keywords

cathodes; microwave tubes; nanoparticles; surface roughness; terahertz wave devices; tungsten; vacuum microelectronics; emission current density; emission surface; high current density dispenser cathode; high current density nanoparticle cathode; high power terahertz devices; particle size; scandate cathode; spherical morphology; surface roughness; terahertz vacuum devices application; tungsten nanoparticle; uniform phase; Cathodes; Current density; Rough surfaces; Surface morphology; Surface roughness; Surface treatment; Tungsten; Dispenser Cathode; nano-particle Cathode; surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International

Conference_Location

Monterey, CA

Print_ISBN

978-1-4673-0188-6

Electronic_ISBN

978-1-4673-0187-9

Type

conf

DOI

10.1109/IVEC.2012.6262199

Filename

6262199