DocumentCode :
2899672
Title :
Effect of surface roughness of high current density nano-particle cathode for terahertz vacuum devices application
Author :
Barik, Ranjan K. ; Tanwar, Anil K. ; Baek, In K. ; Eom, Kihoon ; Bera, Anirban ; Sattorov, Matlabjon A. ; Min, Sun H. ; Kwon, Ohjoon J. ; Park, Gunsik S.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
fYear :
2012
fDate :
24-26 April 2012
Firstpage :
369
Lastpage :
370
Abstract :
High current density dispenser cathode is critical need for used in high power terahertz devices. Recently scandate cathode using nanoparticle offers very high current density more than 100 A/cm2. Fabrication of this kind of cathode is challenging issue due to its nano dimension of the particle size. One of the critical parameter is surface roughness of the emission surface. We develop dispenser cathode using tungsten nano-particle of average particle diameter ~50 nm, spherical morphology and uniform phase. In this paper we explain the effect of surface roughness on the emission current density of the dispenser cathode.
Keywords :
cathodes; microwave tubes; nanoparticles; surface roughness; terahertz wave devices; tungsten; vacuum microelectronics; emission current density; emission surface; high current density dispenser cathode; high current density nanoparticle cathode; high power terahertz devices; particle size; scandate cathode; spherical morphology; surface roughness; terahertz vacuum devices application; tungsten nanoparticle; uniform phase; Cathodes; Current density; Rough surfaces; Surface morphology; Surface roughness; Surface treatment; Tungsten; Dispenser Cathode; nano-particle Cathode; surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0188-6
Electronic_ISBN :
978-1-4673-0187-9
Type :
conf
DOI :
10.1109/IVEC.2012.6262199
Filename :
6262199
Link To Document :
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