DocumentCode
2899696
Title
Test structures for ISFET chemical sensors
Author
Gràcia, I. ; Cané, C. ; Lozano, M. ; Esteve, J.
Author_Institution
Centre Nacional de Microelectron., Univ. Autonoma de Barcelona, Spain
fYear
1992
fDate
16-19 Mar 1992
Firstpage
156
Lastpage
159
Abstract
Simple test structures and measurements were studied for determining their usefulness for the online monitoring of the aging effects on pH ion sensitive field effect transistor (ISFET) chemical sensors used in automatic systems. Devices consisted of long drain and field transistors and metallic meanders. Current and capacitance measurements were carried out with standard instruments. Results showed that not all the test structures and their related parameters were equally sensitive, and in some cases tests at a high temperature were necessary to accelerate the desired effects. The metallic meander structure proved to be quite sensitive to epoxy-coating degradation. For dielectric passivating layers, the parasitic transistors also showed sensitivity, especially when electrolyte was heated
Keywords
ageing; automatic test equipment; chemical sensors; electric sensing devices; insulated gate field effect transistors; pH measurement; semiconductor device testing; ISFET chemical sensors; aging effects; automatic systems; capacitance measurements; current measurement; dielectric passivating layers; epoxy-coating degradation; metallic meanders; online monitoring; pH ion sensitive; parasitic transistors; test structures; Aging; Automatic testing; Capacitance measurement; Chemical sensors; Computerized monitoring; FETs; Instruments; Measurement standards; System testing; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 1992. ICMTS 1992. Proceedings of the 1992 International Conference on
Conference_Location
San Diego, CA
Print_ISBN
0-7803-0535-3
Type
conf
DOI
10.1109/ICMTS.1992.185959
Filename
185959
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