Title :
Design and characterization of high performance 60 GHz pseudomorphic MODFET LNAs in CPW-technology based on accurate S-parameter and noise models
Author :
Schlechtweg, M. ; Reinert, W. ; Tasker, P.J. ; Bosch, R. ; Braunstein, J. ; Hulsmann, A. ; Kohler, K.
Author_Institution :
Fraunhofer-Inst. fuer Angewandte Festkorperphysik, Freiburg, Germany
Abstract :
Low-noise V-band two-stage amplifiers were fabricated using pseudomorphic MODFETs. They exhibited 10.5-dB gain and a 5.2-dB noise figure at 58.5 GHz, in very close agreement with results predicted in advance. The CAE models for the transistors and the passive coplanar waveguide (CPW) components were extracted from on-wafer S-parameter measurements up to 60 GHz and noise parameter measurements up to 18 GHz. For noise modeling of the MODFETs up to millimeter-wave frequencies, a novel approach based on the temperature-noise model reported by M.W. Pospiezalski (1989) was used. Very good agreement between simulated and measured monolithic microwave integrated circuit (MMIC) gain and noise performances was achieved up to the V-band by using these models.<>
Keywords :
MMIC; S-parameters; field effect integrated circuits; high electron mobility transistors; microwave amplifiers; semiconductor device models; semiconductor device noise; 0.2 to 63.2 GHz; 10.5 dB; 5.2 dB; 58.5 GHz; CAE models; CPW-technology; GaAs substrate; MMIC gain; S-parameter; V-band two-stage amplifiers; millimeter-wave frequencies; noise modeling; noise parameter; passive coplanar waveguide components; pseudomorphic MODFET LNA; temperature-noise model; Coplanar waveguides; HEMTs; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit noise; Low-noise amplifiers; MMICs; MODFET integrated circuits; Noise figure; Noise measurement;
Conference_Titel :
Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1992. Digest of Papers, IEEE 1992
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0677-5
DOI :
10.1109/MCS.1992.185989