DocumentCode :
2900047
Title :
Cathode life test facility - historical review
Author :
Dressman, L.J. ; Warnick, R.L. ; Qualls, A.
Author_Institution :
Naval Surface Warfare Center, Crane, IN, USA
fYear :
2004
fDate :
6-10 Sept. 2004
Firstpage :
149
Abstract :
Summary form only given. The cathode life test facility (CLTE) has performed real-time life testing of various thermionic cathode types since 1980. The facility originated at Rome Laboratories, Griffiss AFB. In 1992, it was moved to it present location at NSWC Crane, Crane Indiana. Since its inception, the facility has accumulated approximated 4 million total life test hours on cathodes of at least eighteen different types. Historically, the most popular cathodes under test have include reservoir cathodes, designated MK (Siemens), RV and V (CPI), and impregnated cathodes, Designated M (Semicon and Hughes), TM (CPI) and MMM (CPI). In addition, smaller numbers of more exotic cathode types have also been tested. Most cathodes are life tested at loadings of 1, 2, and 4 A/cm2 in continuous emission mode. However, a number of cathode (e.g. cathode with 10 A/cm2) have been tested with applied filament power only, due to limitation on the test stations available. A summary of the cathodes tested over the entire life of facility is given and the result obtained is compared. Test vehicle configuration and methods of data collection and analysis are reviewed. Emphasis is placed on comparing different cathodes by type and loading. The usefulness of data is discussed.
Keywords :
data analysis; electron emission; life testing; thermionic cathodes; Rome Laboratories; cathode life test facility; continuous emission mode; data analysis; data collection; impregnated cathodes; real-time life testing; reservoir cathodes; test vehicle configuration; test vehicle methods; thermionic cathode; Cathodes; Cranes; Data analysis; Laboratories; Life testing; Performance evaluation; Reservoirs; Road transportation; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference, 2004. Proceedings. IVESC 2004. The 5th International
Print_ISBN :
0-7803-8437-7
Type :
conf
DOI :
10.1109/IVESC.2004.1414169
Filename :
1414169
Link To Document :
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