• DocumentCode
    2900158
  • Title

    RF output multipaction margin of travelling wave tubes

  • Author

    Dürr, W. ; Wegener, J. ; Bosch, E.

  • Author_Institution
    Thales Electron Devices, Ulm, Germany
  • fYear
    2011
  • fDate
    21-24 Feb. 2011
  • Firstpage
    19
  • Lastpage
    20
  • Abstract
    The paper show the multipaction capability of Thales RF output solutions for today high power L- and S-Band TWTs. Thales accepts that a real prediction of the multipaction onset level of complex coaxial structures like in example a TNC connector, with dielectrics, air gaps and complex electric fields inside, is not possible with today knowledge. Therefore Thales prefers to qualify their RF output interfaces with different multipaction tests, which were assisted by ESA and their multipaction experience. We could demonstrate that our designs have a 6 dB multipaction margin by test and a new multipaction test for L-Band will show if our standard TNC connector will have the same margin or if for high power L-Band applications a SC connector has to be the preferred solution. For very high power S-Band applications we see definitely a WR340 ¼ height waveguide output as the best solution which is already today a standard interface at satellite level. In summary Thales has solved a very critical area for high power tubes in L- and S- band and is able to fulfill today multipaction requirements.
  • Keywords
    coaxial waveguides; electric connectors; electric fields; travelling wave tubes; ESA; L-band travelling wave tube; S-band travelling wave tube; SC connector; TNC connector; Thales RF output multipaction margin; air gap; complex coaxial structure; complex electric field; gain 6 dB; high power tube; waveguide output; Connectors; Electron tubes; L-band; Materials; Radio frequency; Satellite broadcasting; Satellites; L-band; Multipaction; S-band; TWT; Traveling Wave Tube;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2011 IEEE International
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-8662-5
  • Type

    conf

  • DOI
    10.1109/IVEC.2011.5746854
  • Filename
    5746854