Title :
Electron bunching from a DC-biased single surface multipactor
Author :
Hur, Min Sup ; Shin, Dongwon ; Jeon, Seok-Gy ; Kim, Jung-Il ; Kim, Geun-Ju
Author_Institution :
Sch. of Electr. & Comput. Eng., UNIST, Ulsan, South Korea
Abstract :
Generation of electron bunch from a dc-biased, single surface multipactor was studied theoretically and by PIC simulations. The condition for a spatially narrow bunch was obtained and verified by PIC simulations. This kind of multipactor is proposed to be used as a compact electron gun for various applications, such as linear accelerators.
Keywords :
electron guns; microwave switches; particle beam bunching; DC-biased single surface multipactor; PIC simulation; compact electron gun; electron bunching; linear accelerator; spatially narrow bunch; Copper; Discharges (electric); Mathematical model; Numerical stability; Stability analysis; Thermal stability; Trajectory; electron bunch; multipactor; secondary electron;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0188-6
Electronic_ISBN :
978-1-4673-0187-9
DOI :
10.1109/IVEC.2012.6262231
