DocumentCode
2900290
Title
Electron bunching from a DC-biased single surface multipactor
Author
Hur, Min Sup ; Shin, Dongwon ; Jeon, Seok-Gy ; Kim, Jung-Il ; Kim, Geun-Ju
Author_Institution
Sch. of Electr. & Comput. Eng., UNIST, Ulsan, South Korea
fYear
2012
fDate
24-26 April 2012
Firstpage
443
Lastpage
444
Abstract
Generation of electron bunch from a dc-biased, single surface multipactor was studied theoretically and by PIC simulations. The condition for a spatially narrow bunch was obtained and verified by PIC simulations. This kind of multipactor is proposed to be used as a compact electron gun for various applications, such as linear accelerators.
Keywords
electron guns; microwave switches; particle beam bunching; DC-biased single surface multipactor; PIC simulation; compact electron gun; electron bunching; linear accelerator; spatially narrow bunch; Copper; Discharges (electric); Mathematical model; Numerical stability; Stability analysis; Thermal stability; Trajectory; electron bunch; multipactor; secondary electron;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4673-0188-6
Electronic_ISBN
978-1-4673-0187-9
Type
conf
DOI
10.1109/IVEC.2012.6262231
Filename
6262231
Link To Document