Low-frequency noise in GaN diodes

In this paper we will investigate the origin of low-frequency excess noise in GaN-based LEDs. We will present experimental results on the impact of material growth processes on the properties of the low-frequency noise. Based on the results we will present a model on the underlying process for low-frequency excess noise in GaN-based LED structures and their relationship with the degradation of the device due to hot-electron stressing. We also demonstrate the use of low-frequency noise measurement as a characterization tool for the optimization of the growth parameters for the multiple quantum wells.