Ultra-high resolution en-face scanning optical coherence tomography for material investigation

In this work, we combine ultra-high resolution optical coherence tomography (OCT) with the concepts of en-face scanning. We apply the OCT technique for material analysis, where ultra-high resolution is required for imaging of structures with typical sizes of only a few microns like, e.g., the diameter of embedded fibres or the size of inclusions. We demonstrate the benefits of en-face scanning for a selected application where in-plane information is of interest which can hardly be obtained by cross-sectional OCT.