Title :
Inelastic scattering effects and electronic shot noise
Author :
Kumar, Manohar ; Smit, Roel H.M. ; van Ruitenbeek, Jan M. ; Tal, Oren
Author_Institution :
Kamerlingh Onnes Lab., Leiden Univ., Leiden, Netherlands
Abstract :
For the study of junctions formed by single molecules shot noise offers interesting new information that cannot be easily obtained by other means. At low bias it allows, for some cases of interest, determining the transmission probability and the number of current carrying conductance channels. By this method it is possible to identify the cross-over in sign of the inelastic scattering signal in the differential conductance. This is a first step towards the study of inelastic scattering signals in shot noise, as the second moment of the current.
Keywords :
electric admittance; gold; platinum; probability; shot noise; transmission; Au; Pt; current carrying conductance channels; electronic shot noise; inelastic scattering effects; inelastic scattering signal; transmission probability; Gold; Junctions; Noise; Reservoirs; Scattering; Vibrations; IETS; MCBJ; atomic chain; break junction; inelastic scattering; phonon scattering; shot noise;
Conference_Titel :
Noise and Fluctuations (ICNF), 2011 21st International Conference on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4577-0189-4
DOI :
10.1109/ICNF.2011.5994347
