DocumentCode
2900690
Title
Inelastic scattering effects and electronic shot noise
Author
Kumar, Manohar ; Smit, Roel H.M. ; van Ruitenbeek, Jan M. ; Tal, Oren
Author_Institution
Kamerlingh Onnes Lab., Leiden Univ., Leiden, Netherlands
fYear
2011
fDate
12-16 June 2011
Firstpage
376
Lastpage
380
Abstract
For the study of junctions formed by single molecules shot noise offers interesting new information that cannot be easily obtained by other means. At low bias it allows, for some cases of interest, determining the transmission probability and the number of current carrying conductance channels. By this method it is possible to identify the cross-over in sign of the inelastic scattering signal in the differential conductance. This is a first step towards the study of inelastic scattering signals in shot noise, as the second moment of the current.
Keywords
electric admittance; gold; platinum; probability; shot noise; transmission; Au; Pt; current carrying conductance channels; electronic shot noise; inelastic scattering effects; inelastic scattering signal; transmission probability; Gold; Junctions; Noise; Reservoirs; Scattering; Vibrations; IETS; MCBJ; atomic chain; break junction; inelastic scattering; phonon scattering; shot noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Noise and Fluctuations (ICNF), 2011 21st International Conference on
Conference_Location
Toronto, ON
Print_ISBN
978-1-4577-0189-4
Type
conf
DOI
10.1109/ICNF.2011.5994347
Filename
5994347
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