DocumentCode
2900942
Title
Fault-tolerant design of VLSI circuits and systems
Author
Reddy, Pratapa V C V
Author_Institution
Dept. of Comput. & Electr. Eng., Rochester Inst. of Technol., NY, USA
fYear
1990
fDate
17-21 Sep 1990
Abstract
The ever-increasing complexity of very large scale integration (VLSI) has a considerable impact on the design and implementation of fault-tolerant circuits and systems. The techniques of fault-tolerance are well established. VLSI, however, introduces problems in fault-tolerant design. An overview of the design and implementation of fault-tolerant systems in a VLSI environment is presented
Keywords
VLSI; circuit reliability; integrated circuit technology; redundancy; VLSI circuits; fault-tolerant design; very large scale integration; Circuit faults; Circuits and systems; Diffusion bonding; Fault diagnosis; Fault tolerance; Fault tolerant systems; Integrated circuit reliability; Packaging; Redundancy; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location
Rochester, NY
Type
conf
DOI
10.1109/ASIC.1990.186075
Filename
186075
Link To Document