Title :
The reliability research of grid-controlled traveling wave tube
Author :
Yao, Liucong ; Su, Xiaobao
Author_Institution :
Inst. of Electron., Chinese Acad. of Sci., Beijing, China
Abstract :
This paper has described the reliability of the grid-controlled traveling wave tube (TWT) which caused by the evaporation of the cathode. If the cathode evaporates a lot, the TWT would damage in two cases, such as spark and grid-emission. The analysis of these two problems and the methods we usually used have been shown here.
Keywords :
cathodes; evaporation; reliability; surface phenomena; travelling wave tubes; cathode evaporation; grid control; grid emission; reliability research; spark; traveling wave tube; Atomic layer deposition; Atomic measurements; Cathodes; Circuits; Electron emission; Gold; Hafnium; Optimization methods; Sparks; Temperature dependence;
Conference_Titel :
Vacuum Electron Sources Conference, 2004. Proceedings. IVESC 2004. The 5th International
Print_ISBN :
0-7803-8437-7
DOI :
10.1109/IVESC.2004.1414205
