DocumentCode :
2900984
Title :
SHOCK: A Worst-Case Ensured Sub-Linear Time Pattern Matching Algorithm for Inline Anti-Virus Scanning
Author :
Huang, Nen-Fu ; Tsai, Wen-Yen
Author_Institution :
Inst. of Commun. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2010
fDate :
23-27 May 2010
Firstpage :
1
Lastpage :
5
Abstract :
To detect viruses, worms and, malware in the multi- gigabit environment, it is crucial for modern content-aware network security appliances to have a fast virus scanning scheme.Signature based multi- pattern matching algorithm is the core technology to enable fast virus scanning accurately and quickly. This paper proposes a multi-pattern matching algorithm with a simple shift/hash technique and a novel heuristic by inspecting overlaps between pairs of patterns to ensure both average and worst-case performance. Experimental results show that our algorithm performs 600Mbps to 1.4Gbps faster than the ClamAV AC and BM-based algorithms and achieves a maximum of 3.8Gbps throughput in inline virus scanning while the memory consumption is nearly the same.
Keywords :
Algorithm design and analysis; Communications Society; Computer viruses; Computer worms; Data mining; Data security; Electric shock; Home appliances; Pattern matching; Spatial databases;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications (ICC), 2010 IEEE International Conference on
Conference_Location :
Cape Town, South Africa
ISSN :
1550-3607
Print_ISBN :
978-1-4244-6402-9
Type :
conf
DOI :
10.1109/ICC.2010.5501986
Filename :
5501986
Link To Document :
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