Advances in fabrication error analysis for a mm-wave ring-bar TWT circuit

Author

Sengele, Sean ; Barsanti, Marc ; Hargreaves, Tom ; Armstrong, Carter ; Booske, John H. ; Lau, Yue Ying

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA

fYear

2012

fDate

24-26 April 2012

Firstpage

539

Lastpage

540

Abstract

The development and microfabrication of a millimeter-wave ring-bar slow-wave structure is presented. Dimensional measurements and subsequent HFSS analyses were completed to predict the impact of fabrication errors on phase velocity and interaction impedance. The effect of random fabrication errors on the fundamental and backward-wave gain and bandwidth were explored using a modified Pierce analysis which allowed for random variation of the Pierce parameters along the axis of the TWT.

Keywords

error analysis; microfabrication; millimetre wave tubes; slow wave structures; Pierce analysis; backward-wave gain; dimensional measurements; fabrication error analysis; interaction impedance; microfabrication; millimeter-wave ring-bar slow-wave structure; mm-wave ring-bar TWT circuit; phase velocity; subsequent HFSS analyses; travelling wave tubes; Bandwidth; Electron tubes; Error analysis; Fabrication; Gain; Impedance; Prototypes; Ring-bar; error analysis; mm-wave;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International

Conference_Location

Monterey, CA

Print_ISBN

978-1-4673-0188-6

Electronic_ISBN

978-1-4673-0187-9

Type

conf

DOI

10.1109/IVEC.2012.6262268

Filename

6262268