Title :
Serpentine waveguide 220 GHz millimeter wave amplifier cold test
Author :
Cook, Alan M. ; Joye, Colin D. ; Calame, Jeffrey P. ; Nguyen, Khanh T. ; Vlasov, Alexander ; Wright, Edward L. ; Abe, David K. ; Levush, Baruch
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
Abstract :
We present results of an electromagnetic cold-test of an all-copper, microfabricated 220 GHz serpentine waveguide amplifier circuit. Transmission/reflection measurements are used to determine the ohmic loss, pass band, and cutoff frequency. We observe the effects of fabrication accuracy, including circuit depth and beam tunnel alignment, on the measured electromagnetic properties.
Keywords :
electromagnetic wave reflection; electromagnetic wave transmission; microfabrication; millimetre wave amplifiers; millimetre wave measurement; slow wave structures; all-copper serpentine waveguide amplifier circuit; beam tunnel alignment; circuit depth; cutoff frequency; electromagnetic cold-test; electromagnetic property; fabrication accuracy; frequency 220 GHz; microfabricated serpentine waveguide amplifier circuit; millimeter wave amplifier cold test; ohmic loss; pass band; reflection measurement; transmission measurement; Bandwidth; Electromagnetic waveguides; Fabrication; Loss measurement; Reflection; Solid modeling; Transmission line measurements; microfabrication; millimeter wave amplifier; serpentine folded waveguide; slow wave structure;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0188-6
Electronic_ISBN :
978-1-4673-0187-9
DOI :
10.1109/IVEC.2012.6262272
