Title :
Sensitivity Enhancement of the Nonlinear Refraction Measurements with the Open Z-Scan by Digital Image Processing
Author :
Marcano, A. ; Hernandez, F.E. ; Maillotte, E.
Keywords :
Absorption; Apertures; Charge coupled devices; Digital images; Energy measurement; Length measurement; Nonlinear distortion; Optical coupling; Optical films; Refractive index;
Conference_Titel :
Lasers and Electro-optics Europe, 1996. CLEO/Europe., Conference on
Conference_Location :
Hamburg, Germany
Print_ISBN :
0-7803-3169-9
DOI :
10.1109/CLEOE.1996.562508
